Recharging process of commercial floating-gate MOS transistor in dosimetry application

نویسندگان

چکیده

We investigated the recharging process of commercial floating gate device (EPAD) during six different dose rates and ten irradiation cycles with highest rate. Dose rate dependence dosimeter was observed from 1 Gy/h to 26 ( H 2 O ). There is no change dosimetric characteristic a constant for cycles. The absorbed does not affect drift threshold voltage readings after steps. reprogramming degrading cycles, giving promising potential in application purposes. • Sensitivity increases No characteristics minimum detectable has calculated be 52 mGy (H O).

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ژورنال

عنوان ژورنال: Microelectronics Reliability

سال: 2021

ISSN: ['0026-2714', '1872-941X']

DOI: https://doi.org/10.1016/j.microrel.2021.114322